Title :
Application of chip-level EMC in automotive product design
Author :
Hu, K. ; Weng, H. ; Beetner, D. ; Pommerenke, D. ; Drewniak, J. ; Lavery, K. ; Whiles, J.
Author_Institution :
University of Missouri-Rolla
Keywords :
Automotive engineering; Cables; Clocks; Electromagnetic compatibility; Frequency; Integrated circuit modeling; Integrated circuit noise; Microcontrollers; Product design; Semiconductor device measurement;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
DOI :
10.1109/ISEMC.2006.1706428