DocumentCode
2637098
Title
Concurrent technology, device, and circuit development for EEPROMs
Author
Feldmann, U. ; Kakoschke, R. ; Miura-Mattausch, M. ; Schraud, G.
Author_Institution
Corp. Technol., Siemens AG, Munich, Germany
fYear
1998
fDate
10-13 Feb 1998
Firstpage
123
Lastpage
128
Abstract
Concurrent engineering aims at integrating technology, device and circuit development in parallel. We will show here an example for an EEPROM development case, which has been realized with a transient circuit simulator. A precise unified EEPROM model was developed describing all characteristics with surface potentials dependent on technological parameters. This new exact model enabled us to realize all requested goals from the first wafer run
Keywords
EPROM; circuit CAD; circuit analysis computing; concurrent engineering; EEPROM development; circuit simulator; concurrent engineering; exact model; transient circuit simulator; unified EEPROM model; Circuit simulation; Circuit synthesis; Concurrent engineering; Costs; EPROM; Nonvolatile memory; Pulse measurements; Semiconductor device modeling; Threshold voltage; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference 1998. Proceedings of the ASP-DAC '98. Asia and South Pacific
Conference_Location
Yokohama
Print_ISBN
0-7803-4425-1
Type
conf
DOI
10.1109/ASPDAC.1998.669423
Filename
669423
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