Method of automated BIT false alarms simulation based on EDA

Author

Shi, Junyou ; Li, Jinzhong ; Shi, Meng

Author_Institution

Inst. of Reliability & Syst. Eng., Beihang Univ., Beijing, China

fYear

2011

fDate

21-23 June 2011

Firstpage

1449

Lastpage

1453

Abstract

The principle of built-in test false alarm simulation (BFAS) is analyzed, with the definition of BFAS in this paper. Related false alarm inducing factors simulated by electronic design automation (EDA) techniques are determined, including load variations, power supply disturbances and electromagnetic interferences. The concept of false alarm simulation profile is proposed. The types and simulation modes of false alarm inducing events are analyzed. The automated insertion algorithm of false alarm inducing events and the flow of BFAS are established, and verified using a typical circuit. It is shown that this method is feasible and effective, and can be used to analyze false alarms in the development stage.

Keywords

built-in self test; electromagnetic interference; electronic design automation; power supply circuits; EDA techniques; automated BIT false alarms simulation; built-in test false alarm simulation; electromagnetic interferences; electronic design automation; load variations; power supply disturbances; typical circuit; Analytical models; Data models; Integrated circuit modeling; Interference; Load modeling; Monitoring; Power supplies; built-in test; electronic design automation; false alarm; model; simulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Electronics and Applications (ICIEA), 2011 6th IEEE Conference on

Conference_Location

Beijing

ISSN

pending

Print_ISBN

978-1-4244-8754-7

Electronic_ISBN

pending

Type

conf

DOI

10.1109/ICIEA.2011.5975817

Filename

5975817