Title :
Method of automated BIT false alarms simulation based on EDA
Author :
Shi, Junyou ; Li, Jinzhong ; Shi, Meng
Author_Institution :
Inst. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
Abstract :
The principle of built-in test false alarm simulation (BFAS) is analyzed, with the definition of BFAS in this paper. Related false alarm inducing factors simulated by electronic design automation (EDA) techniques are determined, including load variations, power supply disturbances and electromagnetic interferences. The concept of false alarm simulation profile is proposed. The types and simulation modes of false alarm inducing events are analyzed. The automated insertion algorithm of false alarm inducing events and the flow of BFAS are established, and verified using a typical circuit. It is shown that this method is feasible and effective, and can be used to analyze false alarms in the development stage.
Keywords :
built-in self test; electromagnetic interference; electronic design automation; power supply circuits; EDA techniques; automated BIT false alarms simulation; built-in test false alarm simulation; electromagnetic interferences; electronic design automation; load variations; power supply disturbances; typical circuit; Analytical models; Data models; Integrated circuit modeling; Interference; Load modeling; Monitoring; Power supplies; built-in test; electronic design automation; false alarm; model; simulation;
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2011 6th IEEE Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8754-7
Electronic_ISBN :
pending
DOI :
10.1109/ICIEA.2011.5975817
