• DocumentCode
    2637676
  • Title

    Profiler design with multi-sensor data fusion methods

  • Author

    Lin, Jium-Ming ; Lin, Jiea-Chie

  • Author_Institution
    Chung-Hua Univ., Taipei
  • fYear
    2007
  • fDate
    17-20 Sept. 2007
  • Firstpage
    710
  • Lastpage
    715
  • Abstract
    This research integrated a balance with stylus probe, force actuator, LVDT (linear variable differential transformer), load cell, personal computer, and XYZ-stages into a contact force-controlled Scanning Probe Microscope (SPM) system, such that the surface of the sample would not be destroyed by the contact force produced by the stylus probe. By using PI controller, the contact-force of the probe was feedback for monitoring the force actuator to meet the desired contact-force between the probe and the object as well as to minimize the hysteresis effect of the force actuator In order to raise the performance of the system, an optical system as well as a piezo-stage were also set up and applied the optical system was accomplished by placing a reflective mirror at the upper middle point of balance lever arm, then a microscope as well as a CCD camera were used to detect the reflective beam displacement of a He-Ne laser. Thus one can apply the Kalman filtering technique respectively to the measurements obtained by either electro-mechanical or optical system first, and then integrating these two results by multi-sensor data fusion method to raise the performance of the system.
  • Keywords
    CCD image sensors; Kalman filters; PI control; actuators; differential transformers; scanning probe microscopy; sensor fusion; Kalman filtering technique; PI controller; camera CCD; contact force-controlled scanning probe microscope system; force actuator; hysteresis effect; linear variable differential transformer; multisensor data fusion method; optical system; piezo-stage system; profiler design; reflective beam displacement; stylus probe; Displacement control; Force control; Force feedback; Hydraulic actuators; Microcomputers; Optical control; Optical feedback; Optical filters; Optical microscopy; Scanning probe microscopy; Scanning Probe Microscope (SPM); contact type; surface profiler;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SICE, 2007 Annual Conference
  • Conference_Location
    Takamatsu
  • Print_ISBN
    978-4-907764-27-2
  • Electronic_ISBN
    978-4-907764-27-2
  • Type

    conf

  • DOI
    10.1109/SICE.2007.4421074
  • Filename
    4421074