• DocumentCode
    2637733
  • Title

    Improving Latency of Quantum Circuits by Gate Exchanging

  • Author

    Mohammadzadeh, Naser ; Zamani, Morteza Saheb ; Sedighi, Mehdi

  • Author_Institution
    Comput. Eng. Dept., Amirkabir Univ. of Technol., Tehran, Iran
  • fYear
    2009
  • fDate
    27-29 Aug. 2009
  • Firstpage
    67
  • Lastpage
    73
  • Abstract
    Quantum circuit design flow consists of two main tasks: synthesis and physical design. In the current flows, two procedures are performed subsequently; synthesis converts the design description into a technology-dependent netlist and then physical design takes the fixed netlist, produces layout, and schedules the netlist on the layout. This style of design suffers from limiting the optimization process in the physical design stage, whereas using a flexible netlist and changing it locally during physical design using layout information often can provide more chance to optimize quantum circuit metrics. Focusing on this issue, in this paper, we propose an optimization flow using gate exchanging heuristic to improve the latency of quantum circuits. We have chosen ion trap technology as the underlying technology to study our flow. Our experimental results show that the proposed flow decreases the latency of quantum circuit by about 23% for the attempted benchmarks.
  • Keywords
    CMOS digital integrated circuits; integrated circuit design; optimisation; CMOS design; design description; design flow; flexible netlist; gate exchanging; ion trap technology; latency; optimization flow; quantum circuit; Circuit synthesis; Delay; Design engineering; Design methodology; Design optimization; Digital systems; Integrated circuit technology; Physics computing; Quantum computing; Quantum mechanics; CAD; Gate Exchanging; Ion Trap; Quantum Computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design, Architectures, Methods and Tools, 2009. DSD '09. 12th Euromicro Conference on
  • Conference_Location
    Patras
  • Print_ISBN
    978-0-7695-3782-5
  • Type

    conf

  • DOI
    10.1109/DSD.2009.191
  • Filename
    5350215