• DocumentCode
    2637927
  • Title

    Soft Error Tolerant Asynchronous Circuits Based on Dual Redundant Four State Logic

  • Author

    Friesenbichler, Werner ; Steininger, Andreas

  • Author_Institution
    Embedded Comput. Syst. Group, Vienna Univ. of Technol., Vienna, Austria
  • fYear
    2009
  • fDate
    27-29 Aug. 2009
  • Firstpage
    100
  • Lastpage
    107
  • Abstract
    The continuing downscaling of integrated circuits makes modern devices more susceptible to soft errors. This paper investigates the possibility of using Four-State Logic (FSL) to improve the fault tolerance of digital circuits. FSL is a possible implementation of asynchronous Quasi Delay Insensitive (QDI) logic using a more efficient encoding and handshake protocol. The behavior of asynchronous circuits designed with FSL when subjected to transient faults is analyzed. We present methods based on dual redundancy that allow to detect as well as correct soft errors autonomously. The concept is demonstrated by fault injection experiments.
  • Keywords
    asynchronous circuits; fault tolerance; integrated circuit reliability; asynchronous quasidelay insensitive logic; digital circuits; dual redundancy; dual redundant four state logic; encoding; fault injection experiments; handshake protocol; integrated circuit continuing downscaling; soft error tolerant asynchronous circuits; transient faults; Asynchronous circuits; Circuit faults; Delay; Digital circuits; Encoding; Fault tolerance; Logic circuits; Logic devices; Protocols; Transient analysis; Asynchronous Logic; Dual-Redundancy; Fault Tolerance; Four-State Logic; Soft Error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design, Architectures, Methods and Tools, 2009. DSD '09. 12th Euromicro Conference on
  • Conference_Location
    Patras
  • Print_ISBN
    978-0-7695-3782-5
  • Type

    conf

  • DOI
    10.1109/DSD.2009.142
  • Filename
    5350227