• DocumentCode
    2637935
  • Title

    Integrated state test system of high voltage circuit breakers based on embedded technology

  • Author

    Fan, Yang ; Chenxi, Qiao ; Xiaohui, Zhang ; Jun, Dong ; Yujie, Pei ; Xiaoguang, Hu

  • Author_Institution
    Sch. of Autom. Sci. & Electr. Eng., Beihang Univ., Beijing, China
  • fYear
    2011
  • fDate
    21-23 June 2011
  • Firstpage
    1605
  • Lastpage
    1609
  • Abstract
    It is especially necessary to monitor the operation state of high voltage circuit breakers to ensure the smooth and safe running of power system. This paper presents the construction and principle of a designed system for diagnostic testing of high voltage circuit breakers. The test system is based on the architecture of ARM as processor and embedded LINUX as operating system. Modular design of the hardware platform is proposed. And the hardware platform consists of ARM core board, signal collection module, A/D sample module and result display module. To develop applications, the ARM is transplanted with Qt/Embedded. And the discrete-time Mallet wavelet transform algorithm is used to process coil current signal. This test system has the feature of high reliability, flexible configuration and many characteristic parameters of high voltage circuit breakers can be obtained through it.
  • Keywords
    Linux; analogue-digital conversion; circuit breakers; microprocessor chips; reliability; wavelet transforms; A/D sample module; ARM core board; ARM processor; diagnostic testing; discrete-time Mallet wavelet transform; embedded LINUX operating system; embedded technology; high voltage circuit breakers; integrated state test system; power system; reliability; signal collection module; Circuit breakers; Coils; Driver circuits; Hardware; Linux; Maintenance engineering; Operating systems; ARM; LINUX; Qt/Embedded; discrete-time Mallet wavelet; high voltage circuit breaker;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2011 6th IEEE Conference on
  • Conference_Location
    Beijing
  • ISSN
    pending
  • Print_ISBN
    978-1-4244-8754-7
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/ICIEA.2011.5975847
  • Filename
    5975847