Title :
Satellite Altimetry Applications
Author_Institution :
NASA Wallops Flight Center, Wallops Island, VA, USA
Abstract :
This paper provides the brief background of precision satellite altimetry. A description of satellite altimetry concepts and instrumentation is presented. The parameters measured, supporting data and techniques, as well as physical limitations, are discussed. In addition, results are shown and a variety of applications are emphasized.
Keywords :
aerospace instrumentation; altimeters; artificial satellites; height measurement; remote sensing; precision satellite altimetry; satellite altimetry concepts; satellite altimetry instrumentation; Altimetry; Extraterrestrial measurements; Instruments; Oceans; Radar tracking; Satellites; Sea measurements; Sea surface; Shape measurement; Surface topography;
Conference_Titel :
Microwave Symposium, 1975 IEEE-MTT-S International
Conference_Location :
Palo Alton, CA
DOI :
10.1109/MWSYM.1975.1123266
