Title :
An improved CT testing method for enhancing protective relay performance
Author :
Vandiver, B. ; Apostolov, A. ; Meinhardt, P.
Author_Institution :
OMICRON Electron., Houston, TX, USA
Abstract :
The paper reviews traditional CT testing and its inability to provide critical data necessary for relay transient response analysis. It then introduces a method for making improved field testing resulting in significantly more information about the CT, its performance in the given application and at the actual burden. Use of this expanded test data makes further analysis possible for transient simulation and improved network simulation based on the expanded CT model introduced. This provides key insights to enhancing the protective relay system in both performance and security.
Keywords :
Circuit faults; Circuit testing; Current transformers; Fault currents; Power system simulation; Power system transients; Protection; Protective relaying; Relays; Transient response; current transformers; instrument transformers; modeling; power system simulation; protective relaying; testing; transient response;
Conference_Titel :
Transmission and Distribution Conference and Exposition, 2010 IEEE PES
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
978-1-4244-6546-0
DOI :
10.1109/TDC.2010.5484324