DocumentCode :
2638824
Title :
The Evolution of Automated Microwave Measurements
Author :
Meyer, John H.
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
fYear :
1975
fDate :
12-14 May 1975
Firstpage :
92
Lastpage :
94
Abstract :
Microwave measurements lend themselves to automation because many readings and much computation is often needed to achieve reasonable accuracies. The expense of automated microwave measurements has limited their widespread use for general measurements. However, an international standard for instrument interfaces, more off-the-shelf programmable instruments, and the advent of inexpensive calculator controllers will dramatically increase the utilization of automated microwave measurement techniques.
Keywords :
microwave measurement; standards; automated microwave measurements; inexpensive calculator controllers; instrument interfaces; international standard; off-the-shelf programmable instruments; Automatic control; Automation; Calibration; Costs; Instruments; Measurement standards; Microwave measurements; Particle measurements; Time measurement; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium, 1975 IEEE-MTT-S International
Conference_Location :
Palo Alton, CA
Type :
conf
DOI :
10.1109/MWSYM.1975.1123292
Filename :
1123292
Link To Document :
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