Title :
Interconnection Capacitances Dependence On Further Neighbourhood In The Bus - Experimental Verification Of The Model
Author :
Jarosz, A. ; Pfitzner, A.
Author_Institution :
Inst. of Electron Technol.
Abstract :
An analytical model, taking into account the further neighbourhood influence on interconnection capacitances was proposed in our previous works (Jarosz, 2002). In this paper a method of experimental verification of those formulas and a test chip designed for the AMS 0.35mum technology are presented. Results of measurements and the correctness of the model are discussed
Keywords :
capacitance measurement; integrated circuit interconnections; integrated circuit modelling; 0.35 micron; AMS technology; integrated circuit interconnection; integrated circuit model; interconnection capacitances; Analytical models; Capacitance measurement; Circuit simulation; Computational modeling; Electrons; Integrated circuit interconnections; Parasitic capacitance; Semiconductor device measurement; Testing; Very large scale integration;
Conference_Titel :
Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. Proceedings of the International Conference
Conference_Location :
Gdynia
Print_ISBN :
83-922632-2-7
DOI :
10.1109/MIXDES.2006.1706626
