BIT optimization design of airborne electronic equipment based on reliability

Author

Ma Cun-bao ; Wang Yan-Wen ; Zhang Wei ; Shi Hao-shan

Author_Institution

Sch. of Aeronaut., Northwestern Polytech. Univ., Xian

fYear

2008

fDate

10-12 Dec. 2008

Firstpage

1

Lastpage

4

Abstract

Built-in test (BIT) has direct or indirect influence on reliability, maintainability, availability, lifecycle cost of the airborne electronic equipment. In this paper, we present a BIT optimization design approach based on the reliability. The impact of BIT on the system reliability is analyzed, and the BIT optimization design approach is mainly discussed. In the following, the NLIP (Non-Linear Integer Programming) model of the BIT optimization design is addressed, a demonstration results show that the system reliability and the performance of the BIT design are improved by the proposed approach.

Keywords

avionics; built-in self test; circuit optimisation; circuit reliability; integer programming; nonlinear programming; airborne electronic equipment; built-in test optimization design; lifecycle cost; maintainability; nonlinear integer programming model; reliability; Built-in self-test; Circuit faults; Design optimization; Electronic equipment; Electronic equipment testing; Fault detection; Isolation technology; Linear programming; Maintenance; Reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Systems and Control in Aerospace and Astronautics, 2008. ISSCAA 2008. 2nd International Symposium on

Conference_Location

Shenzhen

Print_ISBN

978-1-4244-3908-9

Electronic_ISBN

978-1-4244-2386-6

Type

conf

DOI

10.1109/ISSCAA.2008.4776363

Filename

4776363