DocumentCode :
2639396
Title :
A neural network approach to hierarchical analog fault diagnosis
Author :
Somayajula, Shyam S.
Author_Institution :
Dept. of Electr. Eng. Texas A&M Univ., College Station, TX, USA
fYear :
1993
fDate :
20-23 Sep 1993
Firstpage :
699
Lastpage :
706
Abstract :
A novel technique involving a neural network for efficient hierarchical fault diagnosis of analog circuits and systems is presented. The fault clustering property of the neural network is utilized to conceptualized the fault equivalence and BC (behavioral condition) reduction at higher levels. It is also shown that fault diagnosis can be done at any desired level and the precision of the diagnosis can be controlled during the fault dictionary generation stage. This technique can be applied to diagnose systems irrespective of their domain of operation as long as they can simulated. The proposed methodology was verified using an OTA-C low pass filter
Keywords :
automatic test equipment; fault diagnosis; hierarchical systems; low-pass filters; pattern recognition; self-organising feature maps; OTA-C low pass filter; fault clustering; hierarchical analog fault diagnosis; neural network; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electronic circuits; Electronic equipment testing; Fault diagnosis; Filters; Neural networks; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
Type :
conf
DOI :
10.1109/AUTEST.1993.396286
Filename :
396286
Link To Document :
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