• DocumentCode
    2639396
  • Title

    A neural network approach to hierarchical analog fault diagnosis

  • Author

    Somayajula, Shyam S.

  • Author_Institution
    Dept. of Electr. Eng. Texas A&M Univ., College Station, TX, USA
  • fYear
    1993
  • fDate
    20-23 Sep 1993
  • Firstpage
    699
  • Lastpage
    706
  • Abstract
    A novel technique involving a neural network for efficient hierarchical fault diagnosis of analog circuits and systems is presented. The fault clustering property of the neural network is utilized to conceptualized the fault equivalence and BC (behavioral condition) reduction at higher levels. It is also shown that fault diagnosis can be done at any desired level and the precision of the diagnosis can be controlled during the fault dictionary generation stage. This technique can be applied to diagnose systems irrespective of their domain of operation as long as they can simulated. The proposed methodology was verified using an OTA-C low pass filter
  • Keywords
    automatic test equipment; fault diagnosis; hierarchical systems; low-pass filters; pattern recognition; self-organising feature maps; OTA-C low pass filter; fault clustering; hierarchical analog fault diagnosis; neural network; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electronic circuits; Electronic equipment testing; Fault diagnosis; Filters; Neural networks; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    0-7803-0646-5
  • Type

    conf

  • DOI
    10.1109/AUTEST.1993.396286
  • Filename
    396286