Title :
RF Burnout of Mixer Diodes as Induced Under Controlled Laboratory Conditions and Correlation to Simulated System Performance
Author :
Morris, G.E. ; Anand, Y. ; Higgins, V.J. ; Cook, Christopher ; Hall, G.
Author_Institution :
Electron. Technol. & Devices Lab. (ECOM), Semicond. Devices & Integrated Electron. Tech. Area, US Army, USA
Abstract :
The mixer diode failure in microwave systems using a TR tube protector depends upon (a) rise time of magnetron, (b) harmonics generated by the magnetron and TR tubes, and (c) spike leakage by the TR tubes. This paper describes the study conducted to establish correlation between mixer diode failure in microwave systems using a TR tube and simulated laboratory set up. Diode failure under microsecond RF pulses and static conditions will also be presented.
Keywords :
magnetrons; microwave diodes; microwave mixers; RF burnout; TR tube protector; harmonics; magnetron; microwave system; mixer diode failure; spike leakage; Electron tubes; Laboratories; Magnetic devices; Microwave devices; Nuclear electronics; Power harmonic filters; Power system harmonics; Radio frequency; Semiconductor diodes; System performance;
Conference_Titel :
Microwave Symposium, 1975 IEEE-MTT-S International
Conference_Location :
Palo Alton, CA
DOI :
10.1109/MWSYM.1975.1123325
