DocumentCode
2639436
Title
RF Burnout of Mixer Diodes as Induced Under Controlled Laboratory Conditions and Correlation to Simulated System Performance
Author
Morris, G.E. ; Anand, Y. ; Higgins, V.J. ; Cook, Christopher ; Hall, G.
Author_Institution
Electron. Technol. & Devices Lab. (ECOM), Semicond. Devices & Integrated Electron. Tech. Area, US Army, USA
fYear
1975
fDate
12-14 May 1975
Firstpage
182
Lastpage
183
Abstract
The mixer diode failure in microwave systems using a TR tube protector depends upon (a) rise time of magnetron, (b) harmonics generated by the magnetron and TR tubes, and (c) spike leakage by the TR tubes. This paper describes the study conducted to establish correlation between mixer diode failure in microwave systems using a TR tube and simulated laboratory set up. Diode failure under microsecond RF pulses and static conditions will also be presented.
Keywords
magnetrons; microwave diodes; microwave mixers; RF burnout; TR tube protector; harmonics; magnetron; microwave system; mixer diode failure; spike leakage; Electron tubes; Laboratories; Magnetic devices; Microwave devices; Nuclear electronics; Power harmonic filters; Power system harmonics; Radio frequency; Semiconductor diodes; System performance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium, 1975 IEEE-MTT-S International
Conference_Location
Palo Alton, CA
Type
conf
DOI
10.1109/MWSYM.1975.1123325
Filename
1123325
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