Title :
New computers extend the life of deployed testers
Author_Institution :
Honeywell Inc., St. Louis Park, MN, USA
Abstract :
The DoD has a large investment in automatic test equipment (ATE) and Test Program Sets (TPS), which are developed with the intent that they be used and maintained for the life of the weapon systems that they support. As the life span of a weapon system increases, due to new technology upgrades and driven by obsolescence and mission requirements changes, the associated support equipment becomes obsolete and difficult to maintain. The service life of deployed automatic test equipment (ATE) can be extended by replacing obsolete ATE station control computers with current microprocessor-based computers and emulation software. Changes to the substantial number of existing TPSs are minimized and test execution time, or throughput, may be improved
Keywords :
automatic test equipment; microcomputer applications; military computing; weapons; ATE; DoD; Test Program Sets; VXI computers; automatic test equipment; control computers; deployed testers; emulation software; microprocessor-based computers; mission requirements; obsolescence; service life; weapon; Aerospace electronics; Aerospace testing; Assembly; Automatic test equipment; Automatic testing; Instruments; Life testing; Military computing; System testing; Weapons;
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
DOI :
10.1109/AUTEST.1993.396291
