Offset Loopback Test For IC RF Transceivers

Author

Dabrowski, J.J. ; Ramzan, R.M.

Author_Institution

Linkoping Univ.

fYear

2006

fDate

22-24 June 2006

Firstpage

583

Lastpage

586

Abstract

In this paper we develop an offset loopback test setup for integrated RF transceivers (TRx´s). Basically, addressed are architectures, which are not suitable for direct loopback test such as FDD transceivers or TDD transceivers where the transmitter (Tx) and receiver (Rx) share one frequency synthesizer (called VCO modulating TRx´s). The technique makes use of an extra mixer put on chip to compensate for the incompatibility of the Tx and Rx, i.e. to compensate for a difference between the transmit- and the receive frequency, and/or to introduce a baseband signal needed for test. We discuss the problem in terms of system-level models, which are implemented and verified in Matlabtrade

Keywords

integrated circuit testing; radiofrequency integrated circuits; transceivers; IC RF transceivers; Matlab; baseband signal test; offset loopback test; system level models; Baseband; Computer languages; Frequency synthesizers; Integrated circuit testing; Mathematical model; Radio frequency; Radiofrequency integrated circuits; Transceivers; Transmitters; Voltage-controlled oscillators;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. Proceedings of the International Conference

Conference_Location

Gdynia

Print_ISBN

83-922632-2-7

Type

conf

DOI

10.1109/MIXDES.2006.1706647

Filename

1706647