Title :
Integrated Approach to Microwave Design
Author :
Bandler, J.W. ; Liu, P.C. ; Tromp, H.
Author_Institution :
Dept. of Electr. Eng., McMaster Univ., Hamilton, ON, Canada
Abstract :
A new concept of practical design applicable to microwave circuits and involving, in general, simultaneous centering, tolerancing and tuning is presented. The worst-case tolerance problem falls out as a special case. With such an integrated approach, designs previously regarded as unrealistic might be made more attractive. Practical implementation involving, for example, nonideal components and uncertain reference planes is also treated in this paper from the tolerance point of view.
Keywords :
fault tolerance; microwave integrated circuits; integrated approach; microwave circuits; microwave design; nonideal components; uncertain reference planes; worst-case tolerance problem; Circuit optimization; Circuit simulation; Computational complexity; Cost function; Design automation; Design optimization; Linear matrix inequalities; Microwave circuits; Process design; Transmission line matrix methods;
Conference_Titel :
Microwave Symposium, 1975 IEEE-MTT-S International
Conference_Location :
Palo Alton, CA
DOI :
10.1109/MWSYM.1975.1123334