Title :
Microelectronic component testing using circuit modeling
Author :
Breaux, Paul J. ; Casey, Patrick J. ; Alexander, Jack F.
Author_Institution :
Southwest Res. Inst., San Antonio, TX, USA
Abstract :
Microelectronic components testing and analysis is greatly enhanced through automated circuit modeling. Southwest Research Institute (SwRI) applies automated circuit modeling consistently to reduce the cost and time of performing circuit analysis and testing. Through circuit modeling, a graphical display with performance results are provided to assist the engineer in both troubleshooting microelectronic problem circuits and/or circuit design. Circuit modeling allows circuits to be analyzed on paper, thus reducing circuit board stress with regards to boards that appear to have problem areas. Also, circuit modeling identifies possible design problems before board prototypes are developed. The application of circuit modeling should be considered to reduce the cost and time to perform microelectronic component analysis and testing
Keywords :
circuit CAD; design for testability; economics; fault diagnosis; fault location; integrated circuit design; integrated circuit manufacture; integrated circuit testing; modulators; Southwest Research Institute; circuit analysis; circuit modeling; cost; graphical display; microelectronic component analysis; time; transmitter modulator; troubleshooting; weather radar modulator; Automatic testing; Circuit analysis; Circuit synthesis; Circuit testing; Costs; Design engineering; Displays; Microelectronics; Performance evaluation; Printed circuits;
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
DOI :
10.1109/AUTEST.1993.396312
