Title :
A Bayesian approach to confidence in system testing
Author :
Bukowski, Richard W. ; Kelley, Brian A.
Author_Institution :
Intelligent Autom., Inc., Rockville, MD, USA
Abstract :
The authors present a purely Bayesian technique for computing the probability that the conclusion reached during a fault isolation is correct given only the results of the (potentially unreliable) tests that have been run and information about the reliability of those tests. This technique is then applied to both off-line and real-time system analysis as a means of determining the potential correctness of a fault isolation conclusion as well as to guarantee (if possible) an arbitrarily selected probability that a conclusion is correct
Keywords :
Bayes methods; automatic testing; fault diagnosis; measurement theory; probability; real-time systems; reliability; Bayesian approach; correctness; entropy; fault isolation; integrated diagnostic environment; off-line; probability; real-time; reliability; system analysis; system testing; Automatic testing; Automation; Bayesian methods; Contracts; Logic testing; Programming; Real time systems; Reliability theory; Software testing; System testing;
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
DOI :
10.1109/AUTEST.1993.396317
