Title :
Integrating logic simulation and dependency modeling
Author :
Debany, W.H. ; Daskiewich, Daniel E. ; Unkle, C. Richard
Author_Institution :
Rome Lab., Griffis AFB, NY, USA
Abstract :
Simulatable logic models are used for design and test generation. Dependency models are developed independently to analyze inherent testability characteristics and generate test strategies for diagnosis. This paper describes a set of translation tools that convert logic models into dependency models. These tools reduce both the manual effort required and the chances of undetected errors, as well as streamline configuration management
Keywords :
CAD/CAM; automatic testing; design for testability; fault diagnosis; logic CAD; CAD/CAE; dependency modeling; dependency models; logic models; logic simulation; test strategies; testability characteristics; Circuit faults; Circuit simulation; Circuit testing; Computer aided engineering; Design automation; Hardware; Integrated circuit modeling; Logic design; Logic testing; System testing;
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
DOI :
10.1109/AUTEST.1993.396319