DocumentCode :
2640020
Title :
Influence of thermal aging on the reliability of electrically conductive adhesives
Author :
Barto, Seba ; Cinert, Jakub ; Mach, Pavel
Author_Institution :
Dept. of Electrotechnol., Czech Tech. Univ. in Prague, Prague, Czech Republic
fYear :
2011
fDate :
20-23 Oct. 2011
Firstpage :
305
Lastpage :
308
Abstract :
Quality of electrically conductive adhesives is a main component in electronic packaging. It highly influences the total quality of a product containing such a component. With time and usage, adhesives lose some of the qualities. In some cases, changes in the molecule structure for example, can be responsible for this influence on material characteristics. This process is known as aging. It can badly affect the total electrical conductivity of adhesives and non-linearity, even mechanical properties of adhesive joints can be affected. In research field, aging is applied to test the expected reactions of the most important material parameters of electrically conductive adhesives. It also helps identifying the total operating life of the tested components. This work focuses primarily on analyzing the effect of thermal aging on the resistance of three types of adhesives, one of these adhesives is a two-component type, and the other two are one-component type.
Keywords :
ageing; conductive adhesives; electrical conductivity; electronics packaging; product quality; reliability; thermal analysis; adhesive joints; electrical conductivity; electrically conductive adhesive reliability; electronic packaging; material characteristics; mechanical property; molecule structure; product quality; thermal aging effect; Aging; Conductive adhesives; Conductivity; Degradation; Joints; Materials; Resistance; Adhesives; ECA; ICA; Quality; Thermal Aging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Technology in Electronic Packaging (SIITME), 2011 IEEE 17th International Symposium for
Conference_Location :
Timisoara
Print_ISBN :
978-1-4577-1276-0
Electronic_ISBN :
978-1-4577-1275-3
Type :
conf
DOI :
10.1109/SIITME.2011.6102741
Filename :
6102741
Link To Document :
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