DocumentCode
2640044
Title
Applications of concurrent engineering
Author
Barkley, Jeffrey
Author_Institution
GenRad, Inc., Concord, MA, USA
fYear
1993
fDate
20-23 Sep 1993
Firstpage
451
Lastpage
457
Abstract
Over a decade ago, design-to-test entered the electronics industry as an expected savior for reducing test development costs and schedules. While conceptually simple, many companies experienced problems using such a simple approach. Today, concurrent engineering and integrated product development (CE/IPD) are the new industry buzz words. CE/IPD do not represent a single idea or methodology; rather they encompass several methodologies, many of which have been around for a number of years. This paper presents the CE/IPD methodologies used by two companies to improve product and test quality and reduce product development time. While the focus of the CE/IPD effort in each case was in the design and test area, each company used a different combination of methodologies to achieve their goals
Keywords
aerospace industry; design for testability; electronic engineering computing; military systems; product development; aerospace industry; concurrent engineering; electronics industry; integrated product development; military industry; product development time; Aerospace industry; Concurrent engineering; Cost function; Design engineering; Electronic equipment testing; Electronics industry; Job shop scheduling; Manufacturing processes; Product development; Production;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location
San Antonio, TX
Print_ISBN
0-7803-0646-5
Type
conf
DOI
10.1109/AUTEST.1993.396321
Filename
396321
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