• DocumentCode
    2640044
  • Title

    Applications of concurrent engineering

  • Author

    Barkley, Jeffrey

  • Author_Institution
    GenRad, Inc., Concord, MA, USA
  • fYear
    1993
  • fDate
    20-23 Sep 1993
  • Firstpage
    451
  • Lastpage
    457
  • Abstract
    Over a decade ago, design-to-test entered the electronics industry as an expected savior for reducing test development costs and schedules. While conceptually simple, many companies experienced problems using such a simple approach. Today, concurrent engineering and integrated product development (CE/IPD) are the new industry buzz words. CE/IPD do not represent a single idea or methodology; rather they encompass several methodologies, many of which have been around for a number of years. This paper presents the CE/IPD methodologies used by two companies to improve product and test quality and reduce product development time. While the focus of the CE/IPD effort in each case was in the design and test area, each company used a different combination of methodologies to achieve their goals
  • Keywords
    aerospace industry; design for testability; electronic engineering computing; military systems; product development; aerospace industry; concurrent engineering; electronics industry; integrated product development; military industry; product development time; Aerospace industry; Concurrent engineering; Cost function; Design engineering; Electronic equipment testing; Electronics industry; Job shop scheduling; Manufacturing processes; Product development; Production;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    0-7803-0646-5
  • Type

    conf

  • DOI
    10.1109/AUTEST.1993.396321
  • Filename
    396321