DocumentCode
2640061
Title
Measuring thickness based on the grayscale value of C-mode SAM images
Author
Harkai, Endre ; Gordon, Péter
Author_Institution
Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Budapest, Hungary
fYear
2011
fDate
20-23 Oct. 2011
Firstpage
319
Lastpage
322
Abstract
Scanning acoustic microscopy is an analysis tool capable for revealing the inner structure of the samples and detecting inhomogeneities inside them, for material characterization and for measuring the thickness of a given layer. A standard method for thickness measurements is based on observing a so called A-mode echo signal. In this paper the authors present pilot results of a method for thickness measurements based on analyzing the grayscale value of the C-mode image. The method can be used only under certain circumstances, but has the advantage to estimate the thickness of a layer using only the C-mode image.
Keywords
acoustic microscopy; inspection; thickness measurement; A-mode echo signal; C-mode SAM images; grayscale value; material characterization; nondestructive inspection method; scanning acoustic microscopy; thickness measurement; Acoustics; Aluminum; Gray-scale; Materials; Microscopy; Thickness measurement; Ultrasonic variables measurement; Scanning Acoustic Microscopy; grayscale image processing; measuring thickness;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Technology in Electronic Packaging (SIITME), 2011 IEEE 17th International Symposium for
Conference_Location
Timisoara
Print_ISBN
978-1-4577-1276-0
Electronic_ISBN
978-1-4577-1275-3
Type
conf
DOI
10.1109/SIITME.2011.6102744
Filename
6102744
Link To Document