• DocumentCode
    2640061
  • Title

    Measuring thickness based on the grayscale value of C-mode SAM images

  • Author

    Harkai, Endre ; Gordon, Péter

  • Author_Institution
    Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Budapest, Hungary
  • fYear
    2011
  • fDate
    20-23 Oct. 2011
  • Firstpage
    319
  • Lastpage
    322
  • Abstract
    Scanning acoustic microscopy is an analysis tool capable for revealing the inner structure of the samples and detecting inhomogeneities inside them, for material characterization and for measuring the thickness of a given layer. A standard method for thickness measurements is based on observing a so called A-mode echo signal. In this paper the authors present pilot results of a method for thickness measurements based on analyzing the grayscale value of the C-mode image. The method can be used only under certain circumstances, but has the advantage to estimate the thickness of a layer using only the C-mode image.
  • Keywords
    acoustic microscopy; inspection; thickness measurement; A-mode echo signal; C-mode SAM images; grayscale value; material characterization; nondestructive inspection method; scanning acoustic microscopy; thickness measurement; Acoustics; Aluminum; Gray-scale; Materials; Microscopy; Thickness measurement; Ultrasonic variables measurement; Scanning Acoustic Microscopy; grayscale image processing; measuring thickness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Technology in Electronic Packaging (SIITME), 2011 IEEE 17th International Symposium for
  • Conference_Location
    Timisoara
  • Print_ISBN
    978-1-4577-1276-0
  • Electronic_ISBN
    978-1-4577-1275-3
  • Type

    conf

  • DOI
    10.1109/SIITME.2011.6102744
  • Filename
    6102744