• DocumentCode
    2640103
  • Title

    ABBET´s support for the full product life cycle

  • Author

    McGarvey, Robert L.

  • Author_Institution
    AAI Corp., Hunt Valley, MD, USA
  • fYear
    1993
  • fDate
    20-23 Sep 1993
  • Firstpage
    429
  • Lastpage
    436
  • Abstract
    The ABBET (A Broad Based Environment for Test) standard is being developed by the ABBET Subcommittee of the IEEE SCC20 Standards Coordinating Committee. ABBET´s goal is to establish a standard environment that supports product test related needs over the full product life cycle. The ABBET environment will be based on an open framework that manages a test knowledge repository and physical test resources in accordance with accepted test related standards. The environment will support user needs such as testability analysis of new products, specification of test requirements, development of maintenance strategies, test program generation, libraries of reusable test objects, implementation on heterogenous platforms, advanced diagnostic techniques, and continuous improvement of the test process. The development methodology for ABBET entails development of a process activity model and an information model. A programming language binding for software tools will be derived from the language-independent information model. Opportunities for reduced support costs and more effective support are based on the systematic capture and reuse of test knowledge throughout the product life cycle. The ultimate success of ABBET will depend upon its acceptance and support by the commercial market
  • Keywords
    IEEE standards; automatic test equipment; automatic test software; formal specification; programming environments; ABBET; IEEE SCC20 Standards Coordinating Committee; heterogenous platforms; information model; language-independent information model; maintenance strategies; process activity model; product life cycle; programming language; reusable test objects; software tools; specification of test requirements; support costs; test knowledge; test program generation; testability; Computer languages; Continuous improvement; Environmental management; Knowledge management; Life testing; Resource management; Software libraries; Software tools; Standards Coordinating Committees; Standards development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    0-7803-0646-5
  • Type

    conf

  • DOI
    10.1109/AUTEST.1993.396324
  • Filename
    396324