DocumentCode :
2640135
Title :
Progress in specifying the ABBET ATLAS-level test procedure and operator/file interfaces
Author :
Ziegler, Jehuda ; Grasso, Jerry M.
Author_Institution :
ITT Avionics, Clifton, NJ, USA
fYear :
1993
fDate :
20-23 Sep 1993
Firstpage :
411
Lastpage :
418
Abstract :
ABBET (A Broad Band Environment for Test) CAP (Common Ada Packages) (ATLAS-Level Test Procedure Interface) provide the best features of both Ada and ATLAS for automated test program generation by providing the UUT oriented test signal vocabulary of the ATLAS with higher level Ada procedures and data structures. The similarities between the ATLAS and ALTPI constructs make the transition to ABBET relatively straightforward and cost effective. ABBET standardization and Ada´s portability will also help reduce the current multiplicative efforts to develop test programs that defect and isolate the same faults in a system during online BIT, factory production test, and for field and depot level maintenance. ABBET CAP and ALTPI will also serve as targets for the automated test program generation tools at the ABBET Test Strategy and Product Description interfaces that are now under development by the ABBET subcommittee. The faster operation of compiled Ada code compared to interpreted ATLAS, and Ada´s built-in multi-tasking capability which supports running parallel digital and analog tests (when the instruments are available), will considerably reduce the time to find faults and repair UUTs
Keywords :
Ada; automatic programming; automatic test equipment; automatic test software; data structures; fault location; standardisation; user interfaces; ABBET ATLAS-level test procedure; ATLAS; Ada´s portability; Common Ada Packages; UUT; analog tests; automated test program generation; compiled Ada code; data structures; depot level maintenance; factory production test; fault finding; filed maintenance; multi-tasking capability; online BIT; operator/file interfaces; parallel digital tests; repair; standardization; test environment; Automatic testing; Costs; Data structures; Packaging; Production facilities; Production systems; Signal generators; Standardization; System testing; Vocabulary;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
Type :
conf
DOI :
10.1109/AUTEST.1993.396326
Filename :
396326
Link To Document :
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