A broad view of off-equipment integrated diagnostics

Improved acquisition cost and quality of the off-equipment automatic testing systems (ATS) awaits the availability of well defined, machine intelligible, test views of CAE information. This information must include explicit Built-in-Test (BIT), formal test requirements and specifications, as well as ATS models. Once in place, automated transfer and generation of computer aided engineering (CAE) information and concurrent analysis of test requirements and specification during product development can become common practice. A broad based environment for test is currently being defined under the auspices of the IEEE SCC-20. A domain specific, layered architecture will create the opportunity to exploit the wealth of currently available and to be defined CAE information sources and ATS models and usher in an age of commercially available computer aided test (CAT) analysis and generation