Title :
ATE technology trends
Author :
Gooding, Michael J.
Author_Institution :
Electronics & Space Corp., St. Louis, MO, USA
Abstract :
ATE instrumentation has moved from unique designs to standard rack-based instruments, and are now being re-tooled into instrument-on-a-card form factors. The VXI and MMS standards are having as profound an effect on instrumentation as the IEEE-488 bus did in the 1970´s. This paper explores current state-of-the-art ATE hardware and software. It focuses on trends in test technology and their effect on future ATE. The paper addresses specific application areas with potential for international industrial involvement
Keywords :
automatic test equipment; avionics; computer interfaces; peripheral interfaces; standards; ATE technology; ATLAS; Ada; IEEE-488 bus; MMS standards; VXI; avionics; instrument-on-a-card form factors; international industrial involvement; Aerospace electronics; Automatic control; Automatic test equipment; Automatic testing; Electronic equipment testing; Instruments; Military aircraft; Military computing; Space technology; System testing;
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
DOI :
10.1109/AUTEST.1993.396334
