DocumentCode
2640350
Title
ATE evolution: How we slew the ATE giant
Author
Esquivel, Eloy C PE ; Ramirez, Luis F. ; Valchar, Larry L.
Author_Institution
Electron. ATE Software Support Section, Kelly AFB, TX, USA
fYear
1993
fDate
20-23 Sep 1993
Firstpage
343
Lastpage
348
Abstract
TISTE has been developing Test Program Sets (TPSs) for Shop Replaceable Units (SRUs) to be used in repair depot since the mid seventies. Since that time, the business has evolved from using speciality testers to using large multipurpose testers to the present use of several small testers. This paper discusses how and why the small tester concept was implemented and how it has worked in the Electronic ATE Software Support Section
Keywords
automatic test equipment; automatic test software; maintenance engineering; microcomputer applications; military avionics; ATE; Air Force; Fluke; GenRad; MATE; Schlumberger; Shop Replaceable Units; TISTE; TRU; Test Program Sets; repair depot; small tester concept; software support; Automatic test equipment; Circuit testing; Electronic equipment testing; Instruments; Power supplies; Programming; Radio frequency; Software testing; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location
San Antonio, TX
Print_ISBN
0-7803-0646-5
Type
conf
DOI
10.1109/AUTEST.1993.396335
Filename
396335
Link To Document