Title :
Improved test and maintenance via concurrent engineering
Author :
Widner, William R. ; Eldridge, Scott D.
Author_Institution :
IBM Federal Syst. Co., Owego, NY, USA
Abstract :
This paper focuses on how concurrent engineering principles can have a positive impact on mission effectiveness. The paper discusses concurrent engineering, the traditional test program set (TPS) development process, and an advanced TPS development process. It also shows how these positive effects can be measured by the user of a product
Keywords :
automatic test equipment; automatic test software; concurrent engineering; maintenance engineering; military computing; military systems; DoD; TPS; concurrent engineering; military systems; mission effectiveness; test program set; Concurrent engineering; Costs; Design engineering; Hardware; Performance evaluation; Phase measurement; Product design; Product development; Productivity; System testing;
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
DOI :
10.1109/AUTEST.1993.396345
