• DocumentCode
    2640497
  • Title

    Improved test and maintenance via concurrent engineering

  • Author

    Widner, William R. ; Eldridge, Scott D.

  • Author_Institution
    IBM Federal Syst. Co., Owego, NY, USA
  • fYear
    1993
  • fDate
    20-23 Sep 1993
  • Firstpage
    259
  • Lastpage
    265
  • Abstract
    This paper focuses on how concurrent engineering principles can have a positive impact on mission effectiveness. The paper discusses concurrent engineering, the traditional test program set (TPS) development process, and an advanced TPS development process. It also shows how these positive effects can be measured by the user of a product
  • Keywords
    automatic test equipment; automatic test software; concurrent engineering; maintenance engineering; military computing; military systems; DoD; TPS; concurrent engineering; military systems; mission effectiveness; test program set; Concurrent engineering; Costs; Design engineering; Hardware; Performance evaluation; Phase measurement; Product design; Product development; Productivity; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    0-7803-0646-5
  • Type

    conf

  • DOI
    10.1109/AUTEST.1993.396345
  • Filename
    396345
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2640497