DocumentCode :
2640782
Title :
Description of the consolidated automated support system (CASS) electro-optical subsystem (EOSS)
Author :
Nelson, Neil R.
Author_Institution :
Northrop Electron. Syst. Div., Hawthorne, CA, USA
fYear :
1993
fDate :
20-23 Sep 1993
Firstpage :
101
Lastpage :
104
Abstract :
The CASS EOSS has been developed to provide the Navy an automated test capability for electrooptical (EO) sensors. Previous test methods required highly skilled personnel who are completely familiar with a particular EO sensor. These manual test methods required extensive test times and often involved subjective acceptance criteria. The CASS EOSS provides capability for evaluation of visible and infrared sensors, laser transmitters, receivers, trackers and multi-sensor boresight. The system is capable of performing these measurements in a rugged shipboard environment. All of the tests are performed without the use of a display or any operator intervention. This enables lower skill level personnel, with the assistance of the Test Program Set (TPS), to perform maintenance and repair on EO sensors. This results in reduction of maintenance cost with EO sensor performance maintained at a higher level in comparison to manual test methods. This paper provides a brief overview of the test capability and the evaluations performed by the CASS EOSS
Keywords :
automatic test equipment; electronic equipment testing; image sensors; infrared detectors; laser beam applications; maintenance engineering; military equipment; naval engineering; optical tracking; Navy; automated test; consolidated automated support system; cost; electro-optical subsystem; electrooptical sensors; infrared sensors; laser transmitters; maintenance; multi-sensor boresight; receivers; repair; rugged shipboard environment; trackers; visible sensors; Automatic testing; Costs; Displays; Electrooptic devices; Infrared sensors; Lasers and electrooptics; Optical receivers; Optical transmitters; Performance evaluation; Personnel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
Type :
conf
DOI :
10.1109/AUTEST.1993.396362
Filename :
396362
Link To Document :
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