Title :
Mission relevant testing
Author :
Lopez, Marc ; Horman, Mel ; Luu, Thanh ; Orlando, Harold
Author_Institution :
Northrop Corp., Hawthorne, CA, USA
Abstract :
A methodology for determining test criteria based on specific mission requirements has been developed which allows greater flexibility in setting pass/fail criteria for automated testing. The rationale for the introduction of mission relevant testing is given along with an illustrative example of its use. The example shows how mission relevant testing can be useful in providing pass/fail criteria which maximizes the utility of sensor systems in specific missions
Keywords :
automatic testing; electronic equipment testing; infrared detectors; infrared imaging; military systems; FLIR sensor testing; automated testing; minimum resolvable temperature; mission relevant testing; pass/fail criteria; sensor systems; specific mission requirements; test criteria; Aerospace electronics; Automatic testing; Electronic equipment testing; Infrared detectors; Personnel; Production facilities; Signal processing algorithms; System testing; Target recognition; Weapons;
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
DOI :
10.1109/AUTEST.1993.396363
