Title :
Development of high precision X-Y stage using for production and inspection equipment of organic electro luminescence display
Author :
Chung, Myung-Jin ; Yee, Yang-Hee ; Kim, Young-Jung ; Kwak, Sun-Bum
Author_Institution :
Korea Polytech. Univ., Siheung
Abstract :
There is an increasing requirement for controlling linear motion from several ten nanometers to a few hundred of millimeter strokes in the area of the organic electro luminescence display (OLED) production and inspection equipment. The requirements of the high precision X-Y stage are low trajectory following error and high positioning accuracy. To satisfy these requirements, it has to be designed with the minimum velocity ripple and maximum acceleration. In this work, plane type X-Y stage having air bearing guide system is proposed, where each axis using linear motor is mounted on the slotted guide beam, isolation system and control system are used for performance requirement. The developed high precision X-Y stage is verified by performance test. From the performance test, moving stroke is 730mm(X-axis) and 920mm(Y-axis), repeatability is plusmn100 nm (X-axis) and plusmn150 nm(Y-axis), straightness is plusmn2.6 mum (X-axis) and plusmn0.9 mum (Y-axis), flatness is +2.3 mum (X-axis) and plusmn0.4 mum (Y-axis), velocity ripple is 0.19% (X-axis) and 0.47% (Y-axis) at 50 mm/sec at each direction, and in position stability is plusmn69 nm (X-axis) and plusmn59 nm (Y-axis).
Keywords :
electroluminescent displays; inspection; linear motors; linear systems; motion control; production equipment; air bearing guide system; control system; high precision X-Y stage; inspection equipment; isolation system; linear motion control; linear motor; maximum acceleration; minimum velocity ripple; organic electro luminescence display; production equipment; slotted guide beam; Acceleration; Control systems; Flat panel displays; Inspection; Luminescence; Motion control; Organic light emitting diodes; Production; Stability; Testing; High precision X-Y stage; OLED; Production and Inspection Equipment;
Conference_Titel :
SICE, 2007 Annual Conference
Conference_Location :
Takamatsu
Print_ISBN :
978-4-907764-27-2
Electronic_ISBN :
978-4-907764-27-2
DOI :
10.1109/SICE.2007.4421248