• DocumentCode
    2640860
  • Title

    Two-Level Microprocessor-Accelerator Partitioning

  • Author

    Sirowy, Scott ; Wu, Yonghui ; Lonardi, Stefano ; Vahid, Frank

  • Author_Institution
    Dept. of Comput. Sci. & Eng., California Univ., Riverside, CA
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The integration of microprocessors and field-programmable gate array (FPGA) fabric on a single chip increases both the utility and necessity of tools that automatically move software functions from the microprocessor to accelerators on the FPGA to improve performance or energy. Such hardware/software partitioning for modern FPGAs involves the problem of partitioning functions among two levels of accelerator groups - tightly-coupled accelerators that have fast single-clock-cycle memory access to the microprocessor´s memory, and loosely-coupled accelerators that access memory through a bridge to avoid slowing the main clock period with their longer critical paths. This new two-level accelerator-partitioning problem was introduced, and a novel optimal dynamic programming algorithm was described to solve the problem. By making use of the size constraint imposed by FPGAs, the algorithm has what is effectively quadratic runtime complexity, running in just a few seconds for examples with up to 25 accelerators, obtaining an average performance improvement of 35% compared to a traditional single-level bus architecture
  • Keywords
    dynamic programming; field programmable gate arrays; logic design; microprocessor chips; FPGA fabric; hardware-software partitioning; microprocessor-accelerator partitioning; microprocessors-field-programmable gate array integration; optimal dynamic programming algorithm; quadratic runtime complexity; Acceleration; Bridges; Clocks; Dynamic programming; Fabrics; Field programmable gate arrays; Hardware; Microprocessors; Software performance; Software tools;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364610
  • Filename
    4211815