• DocumentCode
    2640920
  • Title

    Effort-index-based software reliability growth models and performance assessment

  • Author

    Huang, Chin-Yu ; Kuo, Sy-Yen ; Lyu, Michael R.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    454
  • Lastpage
    459
  • Abstract
    The authors show that the logistic testing effort function is practically acceptable/helpful for modeling the software reliability growth and providing a reasonable description of resource consumption. Therefore, in addition to the exponential shaped models, we integrate the logistic testing effort function into an S-shaped model for further analysis. The model is designated as the Yamada Delayed S-shaped model. A realistic failure data set is used in the experiments to demonstrate the estimation procedures and results. Furthermore, the analysis of the proposed model under an imperfect debugging environment is investigated. In fact, from these experimental results and discussions, it is apparent that the logistic testing-effort function is very suitable for making estimations of resource consumption during the software development/testing phase
  • Keywords
    program debugging; program testing; software performance evaluation; software reliability; Yamada Delayed S-shaped model; effort-index based software reliability growth models; estimation procedures; exponential shaped models; imperfect debugging environment; logistic testing effort function; realistic failure data set; resource consumption; software development/testing phase; software performance assessment; Calendars; Computer science; Debugging; Delay; Logistics; Programming; Reliability engineering; Software quality; Software reliability; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Software and Applications Conference, 2000. COMPSAC 2000. The 24th Annual International
  • Conference_Location
    Taipei
  • ISSN
    0730-3157
  • Print_ISBN
    0-7695-0792-1
  • Type

    conf

  • DOI
    10.1109/CMPSAC.2000.884764
  • Filename
    884764