Title :
Design and implementation of the multilevel test philosophy
Author :
Hardenburg, Gary ; Duong, Thao
Author_Institution :
GDE Systems, Inc., San Diego, CA, USA
Abstract :
This paper describes the design and implementation of a Test Program Set (TPS) based on a multilevel test philosophy. The multilevel test philosophy not only incorporates the concepts of vertical testability and directed diagnostics, but also explores the test strategy and test encapsulation concepts being defined by the IEEE A Broad Based Environment for Test (ABBET) subcommittee
Keywords :
automatic test software; electronic equipment testing; fault diagnosis; fault location; military computing; societies; Air Force; IEEE A Broad Based Environment for Test; Test Program Set; directed diagnostics; multilevel test philosophy; test encapsulation; test strategy; vertical testability; Databases; Displays; Encapsulation; Fault detection; Packaging; Performance evaluation; Prototypes; Software prototyping; Software testing; System testing;
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
DOI :
10.1109/AUTEST.1993.396370
