Title :
Converting test requirements into test program sets
Author :
Debany, Warren H. ; Koziarz, Nancy A. ; Nagy, James M.
Author_Institution :
Rome LAb., Griffiss AFB, NY, USA
Abstract :
A new approach is described for converting a minimal set of test requirements and a set of test vectors into a working test program set (TPS). A test requirements file (TRF) expresses all of the necessary information for testing the logical functions and electrical and switching performance of a device-under-test. The TRF and the test vector files are processed automatically to produce the TPS. Test requirements are audited for correctness or reasonableness, and some types of tests can be generated automatically if their specifications are omitted
Keywords :
automatic test software; automatic testing; electronic equipment testing; formal specification; logic testing; program verification; correctness; device-under-test; logical functions; reasonableness; switching performance; test program sets; test requirements file; test vector files; Automatic testing; Circuit testing; Design automation; Laboratories; Logic testing; Packaging; Performance evaluation; Pins; Standards development; Very high speed integrated circuits;
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
DOI :
10.1109/AUTEST.1993.396371
