Title :
Coupling canceller maximum-likelihood (CCML) detection for multi-level cell NAND flash memory
Author :
Park, Donghyuk ; Kim, Jinyoung ; Lee, Jaejin
Abstract :
In multi-level cell NAND flash memory system, the margin of each threshold voltage is narrower according as the number of bits per cell is increased, and the major factor degrading the performance of conventional threshold detection is coupling from neighbor cells. We propose a coupling canceller maximum-likelihood (CCML) detection for increasing the read performance of multi-level cell NAND flash memory.
Keywords :
NAND circuits; flash memories; maximum likelihood decoding; multivalued logic circuits; coupling canceller maximum likelihood detection; multilevel cell NAND flash memory; threshold detection; threshold voltage; Couplings; Detectors; Flash memory; Maximum likelihood detection; Maximum likelihood estimation; Noise; Programming;
Conference_Titel :
Consumer Electronics (ICCE), 2011 IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-8711-0
DOI :
10.1109/ICCE.2011.5722627
