Title :
Design of High-Resolution MOSFET-Only Pipelined ADCs with Digital Calibration
Author :
Aminzadeh, Hamed ; Danaie, Mohammad ; Lotfi, Reza
Author_Institution :
Dept. of EE, Ferdowsi Univ. of Mashhad
Abstract :
Design of low-voltage high-resolution MOSFET-only pipeline analog to digital converters (ADCs) has been investigated in this work. The nonlinearity caused by replacing linear MIM capacitors with compensated depletion-mode MOS transistors in all 1.5-bit residue stages of the ADC has been properly modeled to be calibrated in digital domain. The proposed calibration technique makes it possible to digitally compensate the nonlinearity of a 1.8V 12-bit 65MS/s MOSFET-only ADC in 0.18 mum standard digital CMOS technology. It improves the values of signal-to-noise-plus-distortion-ratio (SNDR) and spurious-free dynamic range (SFDR) by approximately 27dB and 35dB respectively
Keywords :
CMOS digital integrated circuits; MOS capacitors; MOSFET; analogue-digital conversion; calibration; compensation; 0.18 micron; 1.8 V; 12 bit; depletion-mode MOS transistors; digital CMOS technology; digital calibration; high-resolution MOSFET-only ADC; low-voltage ADC; nonlinearity compensation; pipelined ADC; Analog-digital conversion; CMOS technology; Calibration; Capacitance; Capacitance-voltage characteristics; Costs; MIM capacitors; MOS capacitors; MOSFET circuits; Voltage;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
DOI :
10.1109/DATE.2007.364629
