DocumentCode :
2641786
Title :
Concurrent L- and S-band class-E power amplifier in 65nm CMOS
Author :
Zhang, Ronghui ; Acar, Mustafa ; Apostolidou, Melina ; Van der Heijden, Mark P. ; Leenaerts, Domine M W
Author_Institution :
NXP Semicond., Eindhoven, Netherlands
fYear :
2012
fDate :
17-19 June 2012
Firstpage :
217
Lastpage :
220
Abstract :
A 65nm CMOS concurrent dual-band two-stage class-E power amplifier (PA) using high voltage extended-drain devices is presented. To implement sub-optimum class-E load impedance at L-band (1.0-1.3GHz) and S-band (2.8-3.1GHz), a concurrent transmission-line based dual-band output matching network is designed. The measurements show a drain efficiency (η) >; 61% and a power-added efficiency (PAE) >; 50.5% for L-band (1.0-1.3GHz) with a output power Pout >; 30.4dBm. For S-band (2.8-3.1GHz) a η >; 42.6% and a PAE >; 30% with a Pout >; 28.9dBm are achieved. The output power variations are within 0.8dB and 1.6dB, respectively.
Keywords :
CMOS analogue integrated circuits; UHF power amplifiers; nanoelectronics; CMOS; CMOS concurrent dual-band two-stage class-E power amplifier; L-band class-E power amplifier; S-band class-E power amplifier; class-E load impedance; concurrent transmission-line based dual-band output matching network; drain efficiency; frequency 1 GHz to 3.1 GHz; high voltage extended-drain device; power-added efficiency; size 65 nm; CMOS integrated circuits; Dual band; Impedance; Impedance matching; L-band; Power generation; Switches; CMOS power amplifier; Class-E; Dual-band;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2012 IEEE
Conference_Location :
Montreal, QC
ISSN :
1529-2517
Print_ISBN :
978-1-4673-0413-9
Electronic_ISBN :
1529-2517
Type :
conf
DOI :
10.1109/RFIC.2012.6242267
Filename :
6242267
Link To Document :
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