• DocumentCode
    2641799
  • Title

    Statistical Dual-Vdd Assignment for FPGA Interconnect Power Reduction

  • Author

    Lin, Yan ; He, Lei

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Field programmable dual-Vdd interconnects are effective to reduce FPGA power. However, the deterministic Vdd assignment leverages timing slack exhaustively and significantly increases the number of near-critical paths, which results in a degraded timing yield with process variation. In this paper, we present two statistical Vdd assignment algorithms. The first greedy algorithm is based on sensitivity while the second one is based on timing slack budgeting. Both minimize chip-level interconnect power without degrading timing yield. Evaluated with MCNC circuits, the statistical algorithms reduce interconnect power by 40% compared to the single- Vdd FPGA with power gating. In contrast, the deterministic algorithm reduces interconnect power by 51% but degrades timing yield from 97.7% to 87.5%
  • Keywords
    deterministic algorithms; field programmable gate arrays; greedy algorithms; integrated circuit interconnections; statistical analysis; timing; chip-level interconnect; field programmable gate arrays; process variation; timing slack budgeting; timing yield; Degradation; Delay; Field programmable gate arrays; Greedy algorithms; Integrated circuit interconnections; Switches; Switching converters; Timing; Wire; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364665
  • Filename
    4211870