DocumentCode :
2641799
Title :
Statistical Dual-Vdd Assignment for FPGA Interconnect Power Reduction
Author :
Lin, Yan ; He, Lei
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA
fYear :
2007
fDate :
16-20 April 2007
Firstpage :
1
Lastpage :
6
Abstract :
Field programmable dual-Vdd interconnects are effective to reduce FPGA power. However, the deterministic Vdd assignment leverages timing slack exhaustively and significantly increases the number of near-critical paths, which results in a degraded timing yield with process variation. In this paper, we present two statistical Vdd assignment algorithms. The first greedy algorithm is based on sensitivity while the second one is based on timing slack budgeting. Both minimize chip-level interconnect power without degrading timing yield. Evaluated with MCNC circuits, the statistical algorithms reduce interconnect power by 40% compared to the single- Vdd FPGA with power gating. In contrast, the deterministic algorithm reduces interconnect power by 51% but degrades timing yield from 97.7% to 87.5%
Keywords :
deterministic algorithms; field programmable gate arrays; greedy algorithms; integrated circuit interconnections; statistical analysis; timing; chip-level interconnect; field programmable gate arrays; process variation; timing slack budgeting; timing yield; Degradation; Delay; Field programmable gate arrays; Greedy algorithms; Integrated circuit interconnections; Switches; Switching converters; Timing; Wire; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
Type :
conf
DOI :
10.1109/DATE.2007.364665
Filename :
4211870
Link To Document :
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