Title :
Storage reliability assessment for missile-borne electronic products with small sampling based on Bayes theorem
Author :
Zhijie, Shao ; Qingzhen, Zhang ; Yunpeng, Li ; Xuesong, Ni
Author_Institution :
Sch. of Autom. Sci. & Electr. Eng., Beihang Univ., Beijing, China
Abstract :
Based on the characteristic of small sampling of missile-borne electronic product, the life distribution form, the essential prior data and Storage Reliability composition of Missile-borne electronics products are firstly analyzed; after that, a new assessment algorithm of storage reliability based on Bayes theorem is presented, and the implementing steps of the algorithm are studied in detail, and then the point estimation and one-sided confidence lower limit of the storage reliability are provided. At last an example is given to shown validity of the method.
Keywords :
Bayes methods; electronic products; military equipment; missiles; reliability; sampling methods; storage; Bayes theorem; life distribution form; missile-borne electronic products; one-sided confidence lower limit; point estimation; small sampling; storage reliability assessment; Conferences; Distribution functions; Estimation; Industrial electronics; Reliability engineering; Reliability theory; Bayes Theorem; Small Sample; Storage Reliability Assessment; electronic products; missile-borne;
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2011 6th IEEE Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8754-7
Electronic_ISBN :
pending
DOI :
10.1109/ICIEA.2011.5976033
