Partial scan design methods based on internally balanced structure

In this paper, we theoretically and experimentally show the effectiveness of partial scan design based on internally balanced structure, which is a sequential circuit capable of generating tests with a combinational test generation algorithm. Moreover, we introduce a method of extended partial scan design, which replaces part of not only flip-flops by scan flip-flops but also wires by bypass flip-flops in a sequential circuit, and propose a method of extended partial scan design based on internally balanced structure. Experimental results for benchmark circuits show that the proposed partial scan design and extended partial scan design can be implemented with low area overhead