• DocumentCode
    2641825
  • Title

    Automatic face recognition using neural networks

  • Author

    El-Bakry, Hazem M. ; Abo-Elsoud, Mohy A. ; Kamel, M.S.

  • Author_Institution
    Fac. of Comput. Sci. & Inf. Syst., Mansoura Univ., Egypt
  • fYear
    1999
  • fDate
    22-24 Nov. 1999
  • Firstpage
    105
  • Lastpage
    108
  • Abstract
    Automatic recognition of individuals is a significant problem in the development of pattern recognition. In this paper, we introduce a simple technique for personal identification of human faces in cluttered scenes based on neural nets. In the detection phase, neural nets are used to test whether a window of 20×20 pixels contains a face or not. A major difficulty in the learning process comes from the large database required for face/nonface images. We solve this problem by dividing the data into two groups. Such division results in reduction of computational complexity, thus decreasing the time and memory needed during the image test. For the recognition phase, feature measurements are made through Fourier descriptors. Such features are modified to reduce the number of neurons in the hidden layer. Simulation results for the proposed algorithm show good performance compared with previous results.
  • Keywords
    Fourier analysis; clutter; computational complexity; face recognition; fast Fourier transforms; feature extraction; learning (artificial intelligence); natural scenes; neural nets; visual databases; FFT; Fourier descriptors; automatic face recognition; cluttered scenes; computational complexity; detection phase; face image database; feature measurements; feature modification; hidden layer; image data division; image test memory; image test time; learning process; neural nets; neural networks; neurons; nonface image database; pattern recognition; personal identification; recognition phase; simulation; window face content testing; Face detection; Face recognition; Humans; Image databases; Layout; Neural networks; Pattern recognition; Phase detection; Spatial databases; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 1999. ICM '99. The Eleventh International Conference on
  • Print_ISBN
    0-7803-6643-3
  • Type

    conf

  • DOI
    10.1109/ICM.2000.884816
  • Filename
    884816