DocumentCode :
2641870
Title :
Capturing the interaction of the communication, memory and I/O subsystems in memory-centric industrial MPSoC platforms
Author :
Medardoni, Simone ; Ruggiero, Martino ; Bertozzi, Davide ; Benini, Luca ; Strano, Giovanni ; Pistritto, Carlo
Author_Institution :
ENDIF, Ferrara Univ.
fYear :
2007
fDate :
16-20 April 2007
Firstpage :
1
Lastpage :
6
Abstract :
Industrial MPSoC platforms exhibit increasing communication needs while not yet reverting to revolutionary solutions such as networks-on-chip. On one hand, the limited scalability of shared busses is being overcome by means of multi-layer communication architectures, which are stressing the role of bridges as key contributors to system performance. On the other hand, technology limitations, data footprint and cost constraints lead to platform instantiations with only few on-chip memory devices and with a global performance bottleneck: the memory controller for access to the off-chip SDRAM memory. The complex interaction among system components and the dependency of macroscopic performance metrics on fine-grain architectural features stress the importance of highly accurate modelling and analysis tools. This paper takes its steps from an extensive modelling effort of a complete industrial MPSoC platform for consumer electronics, including the off-chip memory sub-system. Based on this, relevant design issues concerning the communication, memory and I/O architecture and their interaction are addressed, resulting in guidelines for designers of industry-relevant MPSoCs
Keywords :
DRAM chips; SRAM chips; logic design; multiprocessing systems; system-on-chip; I/O subsystems; communication subsystems; consumer electronics; memory controller; memory subsystems; memory-centric industrial MPSoC platforms; multilayer communication architectures; networks-on-chip; off-chip SDRAM memory; on-chip memory devices; Bridges; Communication industry; Communication system control; Costs; Measurement; Performance analysis; SDRAM; Scalability; Stress; System performance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
Type :
conf
DOI :
10.1109/DATE.2007.364669
Filename :
4211874
Link To Document :
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