• DocumentCode
    2641870
  • Title

    Capturing the interaction of the communication, memory and I/O subsystems in memory-centric industrial MPSoC platforms

  • Author

    Medardoni, Simone ; Ruggiero, Martino ; Bertozzi, Davide ; Benini, Luca ; Strano, Giovanni ; Pistritto, Carlo

  • Author_Institution
    ENDIF, Ferrara Univ.
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Industrial MPSoC platforms exhibit increasing communication needs while not yet reverting to revolutionary solutions such as networks-on-chip. On one hand, the limited scalability of shared busses is being overcome by means of multi-layer communication architectures, which are stressing the role of bridges as key contributors to system performance. On the other hand, technology limitations, data footprint and cost constraints lead to platform instantiations with only few on-chip memory devices and with a global performance bottleneck: the memory controller for access to the off-chip SDRAM memory. The complex interaction among system components and the dependency of macroscopic performance metrics on fine-grain architectural features stress the importance of highly accurate modelling and analysis tools. This paper takes its steps from an extensive modelling effort of a complete industrial MPSoC platform for consumer electronics, including the off-chip memory sub-system. Based on this, relevant design issues concerning the communication, memory and I/O architecture and their interaction are addressed, resulting in guidelines for designers of industry-relevant MPSoCs
  • Keywords
    DRAM chips; SRAM chips; logic design; multiprocessing systems; system-on-chip; I/O subsystems; communication subsystems; consumer electronics; memory controller; memory subsystems; memory-centric industrial MPSoC platforms; multilayer communication architectures; networks-on-chip; off-chip SDRAM memory; on-chip memory devices; Bridges; Communication industry; Communication system control; Costs; Measurement; Performance analysis; SDRAM; Scalability; Stress; System performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364669
  • Filename
    4211874