DocumentCode :
2642033
Title :
Method for Reducing Jitter in Multi-Gigahertz ATE
Author :
Keezer, D.C. ; Minier, D. ; Ducharme, P.
Author_Institution :
Georgia Inst. of Technol., Atlanta , GA
fYear :
2007
fDate :
16-20 April 2007
Firstpage :
1
Lastpage :
6
Abstract :
Controlling jitter on a picosecond (or smaller) time scale has become one of the most difficult challenges for testing multi-gigahertz systems. In this paper we present a novel method for reducing jitter in timing-critical ATE signals. This method uses a real-time averaging approach to combine multiple ATE signals and produces timing references with significantly lower random jitter. For example, we demonstrate a 3times reduction in jitter by combining eight ATE signals (each with sigma=4ps) to produce a low-jitter signal (sigma=1.3ps). The measured jitter reduction is shown to closely match that predicted by theory. This counter-intuitive (but welcome) result is of general interest for the design of any low-jitter system, and is particularly helpful for multi-GHz ATE where precise timing is so critical
Keywords :
automatic test equipment; circuit noise; integrated circuit design; integrated circuit testing; jitter; real-time systems; 1.3 ps; 4 ps; ATE; jitter reduction; low-jitter system design; multigigahertz system testing; real-time averaging; Bit error rate; Calibration; Clocks; Control systems; Error probability; Frequency; Logic; Sampling methods; System testing; Timing jitter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
Type :
conf
DOI :
10.1109/DATE.2007.364677
Filename :
4211882
Link To Document :
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