• DocumentCode
    2642033
  • Title

    Method for Reducing Jitter in Multi-Gigahertz ATE

  • Author

    Keezer, D.C. ; Minier, D. ; Ducharme, P.

  • Author_Institution
    Georgia Inst. of Technol., Atlanta , GA
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Controlling jitter on a picosecond (or smaller) time scale has become one of the most difficult challenges for testing multi-gigahertz systems. In this paper we present a novel method for reducing jitter in timing-critical ATE signals. This method uses a real-time averaging approach to combine multiple ATE signals and produces timing references with significantly lower random jitter. For example, we demonstrate a 3times reduction in jitter by combining eight ATE signals (each with sigma=4ps) to produce a low-jitter signal (sigma=1.3ps). The measured jitter reduction is shown to closely match that predicted by theory. This counter-intuitive (but welcome) result is of general interest for the design of any low-jitter system, and is particularly helpful for multi-GHz ATE where precise timing is so critical
  • Keywords
    automatic test equipment; circuit noise; integrated circuit design; integrated circuit testing; jitter; real-time systems; 1.3 ps; 4 ps; ATE; jitter reduction; low-jitter system design; multigigahertz system testing; real-time averaging; Bit error rate; Calibration; Clocks; Control systems; Error probability; Frequency; Logic; Sampling methods; System testing; Timing jitter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364677
  • Filename
    4211882