Title :
A 5 Gbps low noise receiver in 0.13µm CMOS for wireless optical communications
Author :
Nakhkoob, Behrooz ; Hella, Mona M.
Author_Institution :
ECSE Dept., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
A wideband, high gain, and low noise optical receiver targeting imaging architectures for optical wireless communications is presented. For line of sight tracking in optical wireless communications, a switching matrix is employed between the pixel/photodetctor array and the transimpedance amplifier. The optical receiver consists of a low noise wideband TIA, where noise and stability are optimized in the presence of the switch, using a series inductor at the input. The TIA is followed by a limiter with offset cancellation and 50 Ω output buffer capable of 900 mv p-p differential output swing over the 50 Ω resistance of measurement equipment. The receiver implemented in IBM 130nm CMOS technology achieves a bit error rate of 10-12 at 5 Gbps corresponding to 2.8 μA current at the input, in presence of 1 pF input capacitance representing the photodiode. The total power consumption including the on chip 50 Ω differential output buffer is 68 mW from 1.5V DC supply, while the die area including bonding pads and output buffer is 1106 × 895 μm2.
Keywords :
CMOS integrated circuits; buffer circuits; inductors; operational amplifiers; optical receivers; photodetectors; photodiodes; IBM CMOS technology; bit rate 5 Gbit/s; bonding pads; capacitance 1 pF; current 2.8 muA; differential output buffer; imaging architecture; measurement equipment; offset cancellation; photodiode; pixel-photodetector array; power 68 mW; resistance 50 ohm; series inductor; sight tracking; size 0.13 mum; switching matrix; transimpedance amplifier; voltage 1.5 V; wideband high-gain low-noise optical receiver; wireless optical communications; Bandwidth; Noise; Optical receivers; Optical switches; Resistors; CMOS image sensors; Lownoise amplifiers; Optical receivers;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2012 IEEE
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-0413-9
Electronic_ISBN :
1529-2517
DOI :
10.1109/RFIC.2012.6242292