Title :
NTRS-97 - Upcoming Deep Sub Micron Eda Tools Requirements
Author_Institution :
SEMATECH
Keywords :
Application specific integrated circuits; Circuit testing; Clocks; Electronic design automation and methodology; Electronics industry; Integrated circuit manufacture; Manufacturing industries; Productivity; Technology forecasting; USA Councils;
Conference_Titel :
Design Automation Conference 1998. Proceedings of the ASP-DAC '98. Asia and South Pacific
Print_ISBN :
0-7803-4425-1
DOI :
10.1109/ASPDAC.1998.669453
