Title :
RF Reliability Testing of L-Band Power Transistors
Author :
Weisenberger, W. ; Dodson, B.C., Jr. ; Christou, A.
Abstract :
Accelerated life tests using pulsed rf power conditions have been incorporated in order to evaluate the reliability of L-band power transistors for use in phased array RADAR programs. The basic philosophies, test procedures, and diagnostic techniques used will be explained and an explanation of how to use the data will be given.
Keywords :
L-band; Life estimation; Life testing; Phased arrays; Power transistors; Radar; Radio frequency;
Conference_Titel :
Microwave Symposium Digest, 1974 S-MTT International
Conference_Location :
Atlanta, Georgia, USA
DOI :
10.1109/MWSYM.1974.1123511
