Title :
Investigations of RF Induced Burnout in Microwave Mixer Diodes: A Continuing Study
Author :
Morris, G.E. ; Hall, G.A. ; Cook, C.F. ; Higgins, V.J.
Abstract :
Investigations of RF induced burnout in silicon point contact and Schottky barrier mixer diodes at X-band frequencies are presented. SEM observation of diode chip condition was made through a "window" in the package prior to burnout. Comparisons of photographs before and after burnout were used to determine subtle changes in chip topography.
Keywords :
Degradation; Packaging; Radio frequency; Schottky barriers; Schottky diodes; Semiconductor diodes; Silicon; Space vector pulse width modulation; Surface topography; Testing;
Conference_Titel :
Microwave Symposium Digest, 1974 S-MTT International
Conference_Location :
Atlanta, Georgia, USA
DOI :
10.1109/MWSYM.1974.1123512
