DocumentCode :
2642790
Title :
Graduation success as a function of myers-briggs temperament indicators in mechanical engineering
Author :
Bannerot, Richard
Author_Institution :
Univ. of Houston, Houston, TX, USA
fYear :
2009
fDate :
18-21 Oct. 2009
Firstpage :
1
Lastpage :
7
Abstract :
The distributions of Myers-Briggs Type Indicators, Preferences, and Temperaments for entering and graduating BSME students and the mechanical engineering faculty at the University of Houston are presented and compared. Based on long-term averages, the S-, T-, J-, SJ-, ESTJ- and ISTJ- preferring individuals appear to have some positive correlation with success in our mechanical engineering program. For example, individuals preferring ¿sensation¿ over ¿intuition¿, ¿thinking¿ over ¿feeling¿, and ¿judging over ¿perceiving¿, (Myers-Briggs Preferences, S over N, T over F, and J over P, respectively) are about 50% more likely to graduate as those who prefer the opposite. A seven-year longitudinal study produced ¿entering¿ and ¿graduating¿ Myers-Briggs data for 118 students. A detailed analysis of this data determined that there was about a ten per cent net increase in individual E-, S-, T- and J-preferences which was the result of about a 15% actual change toward E-, S-, T-, and J-preferences and a 5% actual change toward I-, N-, F-, and P-preferences. Finally, the shift of the distribution of Myers-Briggs Type Indicators from the entering to the graduating students is seen to be moving toward the distribution exhibited by the faculty.
Keywords :
engineering education; mechanical engineering; Myers-Briggs temperament indicators; University of Houston; engineering students; graduating BSME students; graduation success; mechanical engineering program; Data analysis; Engineering students; Mechanical engineering; Springs; Testing; Myers-Briggs Temperament Indicators distributions for engineering students; effect of Myers-Briggs Temperament Indicators on academic success;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frontiers in Education Conference, 2009. FIE '09. 39th IEEE
Conference_Location :
San Antonio, TX
ISSN :
0190-5848
Print_ISBN :
978-1-4244-4715-2
Electronic_ISBN :
0190-5848
Type :
conf
DOI :
10.1109/FIE.2009.5350638
Filename :
5350638
Link To Document :
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